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The 33rd IEEE Asian Test Symposium (ATS 2024)

The Asian Test Symposium is a premier international conference on semiconductor design, fabrication, and testing. Since its inception in 1992 in Hiroshima, Japan, it has become a key annual event in the Asia Pacific region.

In 2024, the symposium celebrated its 33rd anniversary at Ahmedabad, India, from December 17 to 20, hosted by Nirma University.
ATS-2024 featured a diverse technical program, including:

– 8 pre-conference tutorials
– 11 keynote speeches from industry and academic leaders
– Panel discussion on semiconductor design and manufacturing
– 4 special sessions
– 2 industry forum sessions
– 60+ paper presentations
– PhD competition and best paper award

The conference recognized contributions from legendary figures in semiconductor design and manufacturing, namely, Prof. Janak Patel, Prof. Adit Singh, Prof. V Kamakoti, Shri Navin Bishnoi, Shri Jais Abraham, and Shri Sanjay Churiwala.

Key supporters included the IEEE Computer Society, Test Technology Technical Council (tttc), IEEE Council on Electronic Design Automation, VLSI Society of India (VSI), and Indian Electronics and Semiconductor Association (IESA). Nirma University hosted the event, with sponsorship from Siemens, Infineon, eInfochips, tttc, VSI, MeitY, Nirma University, and Monk Technology.